A Multi-Fault Dynamic Compaction Technique for Test Pattern Count Reduction

Journal

Proceedings - International SoC Design Conference 2018, ISOCC 2018

Pages

9-10

Date Issued

2019

Author(s)

Li, B.-Y.

JIUN-LANG HUANG

DOI

10.1109/ISOCC.2018.8649901

URI

https://scholars.lib.ntu.edu.tw/handle/123456789/501356

URL

https://www.scopus.com/inward/record.uri?eid=2-s2.0-85063190588&doi=10.1109%2fISOCC.2018.8649901&partnerID=40&md5=22c307478291321cbbca28c210af22d4

SDGs

[SDGs]SDG9

Type

conference paper