Using launch-on-capture for testing scan designs containing synchronous and asynchronous clock domains
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Journal Volume
30
Journal Issue
3
Pages
455-463
Date Issued
2011
Author(s)
Wu, S.
Wang, L.-T.
Wen, X.
Jiang, Z.
Tan, L.
Zhang, Y.
Hu, Y.
Jone, W.-B.
Hsiao, M.S.
Li, J.C.-M.
Huang, J.-L.
Type
journal article