Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-in-Self-Test.

Journal

18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada

Pages

237-246

Date Issued

2000

Author(s)

Tofte, Jan Arild

Ong, Chee-Kian

Huang, Jiun-Lang

Cheng, Kwang-Ting (Tim)

DOI

URI

URL

Type

conference paper