https://scholars.lib.ntu.edu.tw/handle/123456789/502115
Title: | Buried oxide thickness effect and lateral scaling of SiGe HBT on SO1 substrate | Authors: | Chang, S.T. Liu, Y.H. CHEE-WEE LIU |
Issue Date: | 2003 | Start page/Pages: | 16-17 | Source: | 2003 International Semiconductor Device Research Symposium, ISDRS 2003 - Proceedings | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/502115 | DOI: | 10.1109/ISDRS.2003.1271974 |
Appears in Collections: | 電機工程學系 |
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