https://scholars.lib.ntu.edu.tw/handle/123456789/516592
Title: | Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET | Authors: | M.-L. Fan V. P.-H. Hu Y.-N. Chen C.-W. Hsu Pin Su C.-T. Chuang VITA PI-HO HU M.-L. Fan V. P.-H. Hu Y.-N. Chen C.-W. Hsu Pin Su C.-T. Chuang 胡璧合 |
Issue Date: | 2015 | Journal Volume: | 62 | Start page/Pages: | 107-113 | Source: | IEEE Transactions on Electron Devices | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516592 | DOI: | 10.1109/ted.2014.2368581 |
Appears in Collections: | 電機工程學系 |
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