https://scholars.lib.ntu.edu.tw/handle/123456789/632305
Title: | Extraction of Complex Permittivity of Dielectrics on Package from W-band to D-band | Authors: | Lin Y.-T Kuo H.-C Wu P.-I Jhong M.-F Pan P.-C Liu C.-Y Wang C.-C TZONG-LIN WU |
Keywords: | Complex permittivity; D band; Dielectric constant; Dielectric loss tangent; Dielectric-material measurements; Packaging material | Issue Date: | 2021 | Journal Volume: | 2021-June | Start page/Pages: | 564-569 | Source: | Proceedings - Electronic Components and Technology Conference | Abstract: | In this paper, a simple method of extracting dielectric material is proposed and copper surface roughness is taken into consideration. The measured results from W-band to D-band are shown to verify the proposed method of extracting complex permittivity of dielectrics. Besides, to validate the proposed transmission line technique, the full sets of complex Sparameters with an appropriate “through-reflect-line” (TRL) calibration pattern are measured as well. It also allows accurate determination of the dielectric constant and loss of thin sheet substrate materials. A great consistency between transmission line technique without calibration and TRL calibration method represents that systematic errors are small. In addition, different samples within the same set of packaging are measured and used to extract dielectric constant and loss tangent, which agree well with each other. © 2021 IEEE |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85124657554&doi=10.1109%2fECTC32696.2021.00100&partnerID=40&md5=8e862642154f89de1d43a711ca98c2e9 https://scholars.lib.ntu.edu.tw/handle/123456789/632305 |
ISSN: | 5695503 | DOI: | 10.1109/ECTC32696.2021.00100 | SDG/Keyword: | Calibration; Dielectric losses; Dielectric materials; Electric lines; Extraction; Packaging; Packaging materials; Surface roughness; Systematic errors; Complex permittivity; Copper surface; D band; Dielectric loss tangent; Dielectric-material measurement; Material measurements; Measured results; SIMPLE method; Transmission line technique; W bands; Permittivity |
Appears in Collections: | 電機工程學系 |
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