https://scholars.lib.ntu.edu.tw/handle/123456789/632328
標題: | Angle position detection based on amorphous silicon four quadrant orientation detector | 作者: | Lin K.-C SI-CHEN LEE |
關鍵字: | Amorphous silicon; Angle position detection; FOQUOD; Thin-film transistor | 公開日期: | 1996 | 卷: | 35 | 期: | 11 | 起(迄)頁: | 5618-5624 | 來源出版物: | Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 摘要: | Using the amorphous silicon active hollow FOur QUadrant Orientation Detector (FOQUOD) which can be used to determine the contrast edge position of the image of an object and its orientation with respect to a horizontal line, two methods are devised to extract the angular positions of an image. The first method uses a signal processing technique to filter the line orientations and two data filter masks to extract the angular position of an image. The second method is to project a test image onto two active hollow FOQUOD arrays in juxtaposition simultaneously with a small relative shift. Then by comparing the position and orientation values of the corresponding cells, the angular position can be extracted. Both methods achieve an accuracy of over 90%. Based on these two methods, a double FOQUOD device which can be used to determine the angle position is designed and fabricated for the first time. The accuracy of determining the angle positions of an arbitrary feature exceeds 60%. |
URI: | https://www.scopus.com/inward/record.uri?eid=2-s2.0-0030284529&doi=10.1143%2fjjap.35.5618&partnerID=40&md5=9c03668732065ee70bfabbc112cc756b https://scholars.lib.ntu.edu.tw/handle/123456789/632328 |
ISSN: | 214922 | DOI: | 10.1143/jjap.35.5618 | SDG/關鍵字: | Angle position detector; Four quadrant orientation detector; Computational methods; Edge detection; Image processing; Metallorganic chemical vapor deposition; Object recognition; Thin film transistors; Amorphous silicon |
顯示於: | 電機工程學系 |
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