公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2004 | Novel MIS Ge-Si quantum-dot infrared photodetectors | Hsu, B.-C.; Lin, C.-H.; Kuo, P.-S.; Chang, S.T.; Chen, P.S.; CHEE-WEE LIU ; Lu, J.-H.; CHIEH-HSIUNG KUAN | IEEE Electron Device Letters | 21 | 21 | |
2004 | Novel MIS Ge–Si Quantum-Dot Infrared Photodetectors | Hsu, B.-C.; Lin, C.-H.; Kuo, P.-S.; Chang, S. T.; Chen, P. S.; Liu, C. W.; Lu, J.-H.; Kuan, C. H. | IEEE Electron Device Letters | | | |
2001 | Novel photodetectors using metal-oxide-silicon tunneling structures | CHEE-WEE LIU ; Hsu, B.-C.; Liu, W.T.; Lin, C.-H.; CHEE-WEE LIU | 2001 International Semiconductor Device Research Symposium, ISDRS 2001 | | | |
2002 | Oxide roughness effect on tunneling current of MOS diodes | CHEE-WEE LIU ; Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; CHEE-WEE LIU | IEEE Transactions on Electron Devices | | | |
2002 | Oxide roughness effect on tunneling current of MOS diodes | Hsu, B.-C.; Chen, K.-F.; Lai, C.-C.; Lee, S.W.; Liu, C.W. | IEEE Transactions on Electron Devices | | | |
2001 | Oxide roughness enhanced reliability of MOS tunneling diodes | CHEE-WEE LIU ; Lin, C.-H.; Lee, M.H.; Hsu, B.-C.; Chen, K.-F.; Shie, C.-R.; CHEE-WEE LIU | 2001 International Semiconductor Device Research Symposium, ISDRS 2001 | | | |
2001 | A PMOS Tunneling Photodetector | Hsu, B.-C.; Liu, C.W.; Liu, W.T.; Lin, C.-H. | IEEE Transactions on Electron Devices | | | |
2004 | Recessed oxynitride dots on self-assembled Ge quantum dots grown by LPD | CHEE-WEE LIU ; Kuo, P.-S.; Hsu, B.-C.; Chen, P.-W.; Chen, P.S.; CHEE-WEE LIU | Electrochemical and Solid-State Letters | | | |
2004 | Recessed Oxynitride Dots on Self-Assembled Ge Quantum Dots Grown by LPD | Kuo, P.-S.; Hsu, B.-C.; Chen, P.-W.; Chen, P. S.; Liu, C. W. | Electrochemical and Solid-State Letters | | | |
2008 | Recovery of chromate from spent plating solutions by two-stage nanofiltration processes | Chen, S.-S.; Hsu, B.-C.; CHUN-HAN KO ; Chuang, P.-C. | Desalination | | | |
2002 | Roughness- Enhanced Reliability of MOS Tunneling Diodes | Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W. | IEEE Electron Device Letters | | | |
2002 | Roughness-enhanced reliability of MOS tunneling diodes | Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W. ; CHEE-WEE LIU | IEEE Electron Device Letters | 6 | 7 | |
2003 | Strain-induced growth of SiO2 dots by liquid phase deposition | Liu, C. W.; Hsu, B.-C.; Chen, K.-F.; Lee, M. H.; Shie, C.-R.; Chen, Pang-Shiu; LiuCW | Applied Physics Letters | | | |
2003 | Strain-induced growth of SiO<inf>2</inf> dots by liquid phase deposition | CHEE-WEE LIU ; Liu, C.W.; Hsu, B.-C.; Chen, K.-F.; Lee, M.H.; Shie, C.-R.; Chen, P.-S.; CHEE-WEE LIU | Applied Physics Letters | | | |