Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
1991 | Enhanced Controllability for IDDQ Test Sets Using Partial Scan. | Chakraborty, Tapan J.; Bhawmik, Sudipta; Bencivenga, Robert; Lin, Chih-Jen; CHIH-JEN LIN | Proceedings of the 28th Design Automation Conference, San Francisco, California, USA, June 17-21, 1991. | | | |
1997 | A Hybrid Algorithm for Test Point Selection for Scan-Based BIST. | Tsai, Huan-Chih; Cheng, Kwang-Ting; Lin, Chih-Jen; Bhawmik, Sudipta; CHIH-JEN LIN | Proceedings of the 34st Conference on Design Automation, Anaheim, California, USA, Anaheim Convention Center, June 9-13, 1997. | | | |
1995 | Integration of partial scan and built-in self-test. | Lin, Chih-Jen; Zorian, Yervant; Bhawmik, Sudipta; CHIH-JEN LIN | J. Electronic Testing | | | |
1993 | PSBIST: A Partial-Scan Based Built-In Self-Test Scheme. | Lin, Chih-Jen; Zorian, Yervant; Bhawmik, Sudipta; CHIH-JEN LIN | Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993 | | | |