https://scholars.lib.ntu.edu.tw/handle/123456789/303335
Title: | An analysis of the kink phenomenon of scattering parameter S22 in RF power MOSFETs for system-on-chip (SOC) applications | Authors: | SHEY-SHI LU | Issue Date: | 2003 | Journal Volume: | 36 | Journal Issue: | 5 | Start page/Pages: | 371-376 | Source: | Microwave and Optical Technology Letters | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0037420174&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/303335 |
DOI: | 10.1002/mop.10767 |
Appears in Collections: | 電機工程學系 |
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