https://scholars.lib.ntu.edu.tw/handle/123456789/324145
Title: | Intelligent process diagnosis based on end-of-line electrical test data | Authors: | Guo, Ruey-Shan Tsai, Cheng-Kai Lee, Jian-Huei SHI-CHUNG CHANG |
Issue Date: | 1996 | Start page/Pages: | 347-354 | Source: | IEEE/CPMT International Electronic Manufacturing Technology (IEMT) Symposium | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0030385243&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/324145 |
Appears in Collections: | 電機工程學系 |
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