https://scholars.lib.ntu.edu.tw/handle/123456789/381392
Title: | Function of the Upper/Lower Parasitic BJTs in 40nm PD SOI NMOS Device due to the Back-Gate Bias Effect | Authors: | A. P. Chuang S. I. Su Z. H. Yang J. B. Kuo D. Chen C. S. Yeh JAMES-B KUO |
Issue Date: | Jan-2013 | Source: | EUROSOI | URI: | http://scholars.lib.ntu.edu.tw/handle/123456789/381392 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.