https://scholars.lib.ntu.edu.tw/handle/123456789/387137
Title: | Gate-bias stress stability of P-type SnO thin-film transistors fabricated by RF-sputtering | Authors: | Chiu, I.-C. Cheng, I.-C. I-CHUN CHENG |
Issue Date: | 2014 | Journal Volume: | 35 | Journal Issue: | 1 | Start page/Pages: | 90-92 | Source: | IEEE Electron Device Letters | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-84891529953&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/387137 |
DOI: | 10.1109/LED.2013.2291896 |
Appears in Collections: | 光電工程學研究所 |
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