https://scholars.lib.ntu.edu.tw/handle/123456789/501349
Title: | On optimizing fault coverage, pattern count, and ATPG run time using a hybrid single-capture scheme for testing scan designs | Authors: | Wu, S. Wang, L.-T. Jiang, Z. Song, J. Sheu, B. Wen, X. Hsiao, M.S. Li, J.C.-M. Huang, J.-L. CHIEN-MO LI JIUN-LANG HUANG |
Issue Date: | 2008 | Start page/Pages: | 143-151 | Source: | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/501349 | DOI: | 10.1109/DFT.2008.29 |
Appears in Collections: | 電機工程學系 |
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