公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2001 | Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data | Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; ARGON CHEN ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings | 12 | 0 | |
2002 | Data Mining Techniques for Engineering Data Analysis: Issues and Solutions | RUEY-SHAN GUO ; M. King; J. Wei; L. Hu; O. Ho; A. Hon; C. Fan; A. Chen | International Symposium on Semiconductor Manufacturing | | | |
2008 | Decision Tree Based Control Chart Pattern Recognition | Wang, Chih-Hsuan; Guo, Ruey-Shan ; Chiang, Ming-Huang ; Wong, Jehn-Yih | International Journal of Production Research | 44 | 27 | |
1997 | Design and Implementation of an Active Furnace Monitoring System in Semiconductor Manufacturing | RUEY-SHAN GUO ; S. Chang; C. Tseng; W. Mao | Automatic Control Conference | | | |
2006 | Design of Supply Chain Contract by Consideration of Risk Pooling and Risk Sharing | RUEY-SHAN GUO ; MING-HUANG CHIANG ; Hung-Jen Lo; Fan-Yun Pai | 7th Asia-Pacific Conference on Industrial Engineering and Management System | | | |
2018 | Disruption or new order?: The emergence of the unicorn bike-sharing entrepreneurship in China | Say A.L.; RUEY-SHAN GUO ; CHUNG-JEN CHEN | PICMET 2018 - Portland International Conference on Management of Engineering and Technology: Managing Technological Entrepreneurship: The Engine for Economic Growth, Proceedings | 5 | 0 | |
2018 | Diversification of Business Group: Capability, Strategy, and Performance | C. Chen; R. Guo ; S. Wang; Y. Lin | | | | |
1998 | A dynamic binding model for service creation in virtual fab | SHI-CHUNG CHANG ; Chou T.-L.; RUEY-SHAN GUO ; Su Y.-H.; Lu L.-L.; Lai I.-C. | 1998 Semiconductor Manufacturing Technology Workshop, SMTW 1998 | 3 | 0 | |
2009 | Dynamic Performance Evaluation for Healthcare Service Innovation – A Case Study for PCA Program at NTUH | RUEY-SHAN GUO ; J. Chen; R. Tsao; D. Chiang; J. Yu | The 10th Asia-Pacific Conference on Industrial Engineering and Management Systems | | | |
2009 | Dynamic Performance Evaluation System for Patient Controlled Analgesia Program | JIUN-YU YU ; RUEY-SHAN GUO ; MING-HUANG CHIANG ; Jo-Lin; Jia-Ying Chen | 10th Asia-Pacific Conference on Industrial Engineering and Management Systems | | | |
2021 | E-Learning in the Postpandemic Era: A Case Study in Taiwan | Lee H; Guo R; CHIA-LIN CHEN ; RUEY-SHAN GUO | IEEE Transactions on Engineering Management | 2 | 3 | |
2000 | An effective SPC approach to monitoring semiconductor manufacturing processes with multiple variation sources | Chen, A.; Guo, R.-S. ; Yeh, P.-J. | IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings | 6 | | |
2000 | An effective SPC approach to monitoring semiconductor quality data with multiple variation sources | Chen, Argon ; Guo, Ruey-Shan ; ARGON CHEN ; RUEY-SHAN GUO | Semiconductor Manufacturing Technology Workshop | 1 | 0 | |
2018 | The Emergence of The Unicorn Bike-Sharing Entrepreneurship in China | A. Say; R. Guo ; C. Chen | | | | |
1996 | End-of-line Quality Control and Abnormal Trend Detection for IC Fabrication | RUEY-SHAN GUO ; J. Lee; S. Chang; J. Fan | Second National Conference on Quality Management | | | |
1999 | Equipment Health Index and Real-time Monitoring | RUEY-SHAN GUO ; A. Chen | Automation Technology Conference | | | |
2007 | Evolutionary business models and inter-firm engineering processes between the foundry and fabless in the semiconductor industry | RUEY-SHAN GUO ; Su Y.-H.; Chiu S.-F.; Pai F.-Y.; Yeh C.-P. | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | | | |
2006 | Evolutionary engineering collaboration for DFM/DFY solutions between foundry and EDA tool vendor | Su Y.-H.; RUEY-SHAN GUO ; Chang H.-H. | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | | | |
2002 | An EWMA-Based Process Mean Estimator with Dynamic Tuning Capability | Guo, Ruey-Shan ; Chen, Jin-Jung | IIE Transactions on Quality and Reliability Engineering | 0 | 6 | |
1997 | EWMA/SD: an end-of-line SPC scheme to monitor sequence-disordered data [semiconductor manufacturing] | Fan, Chih-Min; Guo, Ruey-Shan ; Chang, Shi-Chung | 1997 2nd International Workshop on Statistical Metrology | 0 | 0 | |