公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2008 | Diagnosis of Logic-chain Bridging Faults | CHIEN-MO LI ; Wei-Chih Liu; Wei-Lin Tsai; Hsiu-Ting Lin; CHIEN-MO LI | IEEE Int’l Workshop on RTL and High Level Testing | | | |
2005 | Diagnosis of Multiple Hold-time and Setup-time Faults in Scan Chains | CHIEN-MO LI | IEEE Transactions on Computers | | 31 | |
2008 | Diagnosis of Multiple Scan Chain Timing Faults | CHIEN-MO LI ; W.S. Chuang; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | | 8 | |
2023 | Diagnosis of Quantum Circuits in the NISQ Era | Li, Yu Min; Hsieh, Cheng Yun; Li, Yen Wei; CHIEN-MO LI | Proceedings of the IEEE VLSI Test Symposium | 0 | 0 | |
2005 | Diagnosis of Resistive and Stuck-open Defects in Digital CMOS IC | CHIEN-MO LI ; Li, J. C.-M.; E. J. McCluskey; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | | 26 | |
2004 | Diagnosis of Scan Chains with Multiple Timing Faults Using Single Excitation Patterns | CHIEN-MO LI ; C. K. Yo; CHIEN-MO LI | VLSI/CAD Symposium | | | |
2005 | Diagnosis of Single stuck-at Faults and Multiple Timing Faults in Scan Chains | CHIEN-MO LI | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | | 38 | |
2023 | Diagnosis of Systematic Delay Failures Through Subset Relationship Analysis | Hsieh, Bing Han; Liu, Yun Sheng; CHIEN-MO LI ; Nigh, Chris; Chern, Mason; Bhargava, Gaurav | Proceedings - International Test Conference | | | |
2005 | Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns | CHIEN-MO LI | IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences | | 5 | |
2001 | Diagnosis of Tunneling Opens | CHIEN-MO LI ; Li, J. C.M.; E.J. McCluskey; CHIEN-MO LI | IEEE VLSI Test Symposium | | | |
2020 | Diagnosis technique for Clustered Multiple Transition Delay Faults | You Y.-S; Liu C.-Y; Wu M.-T; Chen P.-W; CHIEN-MO LI | Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 | | | |
2014 | Divide and Conquer Diagnosis for Multiple Defects | CHIEN-MO LI ; SM Chao; PJ Chen; CHIEN-MO LI | IEEE International Test Conference | | | |
2015 | DR Scan: DR-scan: A Test Methodology for Dual-rail Asynchronous Circuit | Shih-An. Hsieh; Y.-H.Wang; K.Y. Huang; CHIEN-MO LI | Design Automation Conference | | | |
2019 | DR-scan: Dual-rail Asynchronous Scan DfT and ATPG | Shih-An Hsieh; Ying-Hsu Wang; Ting-Yu Shen; Kuan-Yen Huang; Chia-Cheng Pai Tsai-Chieh Chen; James Chien-Mo Li; CHIEN-MO LI | IEEE Transactions on Computer Aided Design | 3 | 2 | |
2005 | Effective and Economic Phase Noise Testing for Single Chip TV Tuners | CHIEN-MO LI ; P.C. Lin; J. C.-M. Li; Chih-Ming Chiang; Chuo-Jan Pan; CHIEN-MO LI | VLSI/CAD Symposium | | | |
2008 | Effective and Economic Phase Noise Testing for Single-Chip TV Tuners | CHIEN-MO LI ; J. C.-M. Li; P.-C. Lin; P.-C. Chiang; C.-M. Pan; C.W. Tseng; CHIEN-MO LI | IEEE Transactions on Instrumentation and Measurement | | 0 | |
2018 | Efficient multi-layer obstacle-avoiding region-to-region rectilinear steiner tree construction | Wang, R.-Y.; Pai, C.-C.; Wang, J.-J.; Wen, H.-T.; Pai, Y.-C.; Chang, Y.-W. ; Li, J.C.M.; Jiang, J.-H.R.; JIE-HONG JIANG ; CHIEN-MO LI | Design Automation Conference | 5 | 0 | |
2009 | Electronic Design Automation | CHIEN-MO LI ; J. C.-M. Li; M. Hsiao; CHIEN-MO LI | | | | |
2004 | ELF-Murphy Data on Defects and Test Sets | CHIEN-MO LI ; E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI | IEEE VLSI Test Symposium | | | |
2002 | Experimental Results for Slow Speed Testing | CHIEN-MO LI ; C.W.Tseng; J.C.M. Li; E. J. McCluskey; CHIEN-MO LI | IEEE VLSI Test Symposium | | | |