Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2013 | Test Generation of Path Delay Faults Induced by Defects in Power TSV | CHIEN-MO LI ; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI | IEEE Asian Test Symposium | |||
2013 | Testing Leakage Faults of Power TSV in 3D IC | CHIEN-MO LI ; Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI | IEEE Int’l workshop on 3D IC |