公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2010 | Competitiveness between direct and indirect radiative transitions of Ge | CHEE-WEE LIU ; Cheng, T.-H.; Ko, C.-Y.; Chen, C.-Y.; Peng, K.-L.; Luo, G.-L.; Liu, C.W.; Tseng, H.-H.; CHEE-WEE LIU | Applied Physics Letters | | | |
2014 | Effect of surface Si redistribution on the alignment of Ge dots grown on pit-patterned Si(001) substrates | CHIEH-HSIUNG KUAN ; SAO-JIE CHEN ; Chen, H.-M.; Suen, Y.-W.; Chen, S.-J.; Luo, G.-L.; Lai, Y.-P.; Chen, S.-T.; Lee, C.-H.; CHIEH-HSIUNG KUAN ; SAO-JIE CHEN | Nanotechnology | | | |
2019 | High Dopant Activation of Phosphorus in Strained and Relaxed GeSn by Rapid Thermal Annealing and Microwave Annealing | Liu, J.-Y.; Chiu, P.-Y.; Chuang, Y.; Liu, C.-Y.; Luo, G.-L.; JIUN-YUN LI | 2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019 | | | |
2019 | A High I<inf>ON</inf>/I<inf>OFF</inf> Ratio of 6 × 105 in Germanium-Tin n+/p Junctions by Phosphorus Ion Implantation | Liu, J.-Y.; Chuang, Y.; Liu, C.-Y.; Luo, G.-L.; JIUN-YUN LI | 2019 Electron Devices Technology and Manufacturing Conference, EDTM 2019 | | | |
2011 | High quality Ge thin film grown by ultrahigh vacuum chemical vapor deposition on GaAs substrate | CHEE-WEE LIU ; Tang, S.-H.; Chang, E.Y.; Hudait, M.; Maa, J.-S.; Liu, C.-W.; Luo, G.-L.; Trinh, H.-D.; Su, Y.-H.; CHEE-WEE LIU | Applied Physics Letters | | | |
2012 | Thermally induced morphology evolution of pit-patterned Si substrate and its effect on nucleation properties of Ge dots | CHIEH-HSIUNG KUAN ; Chen, H.-M.; Kuan, C.-H.; Suen, Y.-W.; Luo, G.-L.; Lai, Y.-P.; Wang, F.-M.; Chen, S.-T.; CHIEH-HSIUNG KUAN | Nanotechnology | | | |
2019 | Voltage Transfer Characteristic Matching by Different Nanosheet Layer Numbers of Vertically Stacked Junctionless CMOS Inverter for SoP/3D-ICs applications | Sung, P.-J.; Chang, C.-Y.; Chen, L.-Y.; Kao, K.-H.; Su, C.-J.; Liao, T.-H.; Fang, C.-C.; Wang, C.-J.; Hong, T.-C.; Jao, C.-Y.; Hsu, H.-S.; Luo, S.-X.; Wang, Y.-S.; Huang, H.-F.; Li, J.-H.; Huang, Y.-C.; Hsueh, F.-K.; Wu, C.-T.; Huang, Y.-M.; Hou, F.-J.; Luo, G.-L.; Huang, Y.-C.; Shen, Y.-L.; Ma, W.C.-Y.; Huang, K.-P.; Lin, K.-L.; Samukawa, S.; Li, Y.; Huang, G.-W.; Lee, Y.-J.; Li, J.-Y.; Wu, W.-F.; Shieh, J.-M.; Chao, T.-S.; Yeh, W.-K.; Wang, Y.-H.; JIUN-YUN LI | Technical Digest - International Electron Devices Meeting, IEDM | | | |