https://scholars.lib.ntu.edu.tw/handle/123456789/151671
Title: | Novel electroluminescence from metal-insulator-semiconductor (MIS) structures on Si | Authors: | CHING-FUH LIN MIIN-JANG CHEN Liang, Eih-Zhe Liu, W.T. Chang, S.T. CHEE-WEE LIU |
Issue Date: | Dec-00 | Journal Volume: | 2000-January | Start page/Pages: | 403-406 | Source: | Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD | Conference: | Conference on Optoelectronic and Microelectronic Materials and Devices, COMMAD 2000 | Abstract: | Room temperature electroluminescence from metal-insulator-semiconductor (MIS) structures on Si was observed. Several types of MIS structures such as Al/SiO2/Si, ITO/SiO2/Si, and mechanically pressed ITO/Si contact, has been investigated. Both band-edge and visible electroluminescence are observed from the ITO/SO2/Si structures. The devices based on the Al/SiO2/Si structure exhibit efficient band-edge electroluminescence. Electroluminescence near the silicon bandgap energy is also achieved from MIS structures using an innovative mechanically pressed ITO/Si contact. Optical phonons, interface roughness, localized carriers and impact ionization are used to explain radiative recombination in MIS structures. © 2000 IEEE. |
URI: | http://ntur.lib.ntu.edu.tw//handle/246246/2007041910043023 http://ntur.lib.ntu.edu.tw/bitstream/246246/2007041910043023/1/01022975.pdf https://www.scopus.com/inward/record.uri?eid=2-s2.0-84949771253&doi=10.1109%2fCOMMAD.2000.1022975&partnerID=40&md5=f3e22e4f0bb573757f7e079b31eee076 |
ISSN: | N/A | Other Identifiers: | N/A | DOI: | 10.1109/COMMAD.2000.1022975 | SDG/Keyword: | Aluminum; Electroluminescence; Impact ionization; Metal insulator boundaries; Microelectronics; MIS devices; Semiconductor insulator boundaries; Band edge; Interface roughness; Localized carriers; Metal insulator semiconductor structures; MIS structure; Optical phonons; Radiative recombination; Silicon band gap; Semiconducting silicon |
Appears in Collections: | 電機工程學系 |
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01022975.pdf | 276.06 kB | Adobe PDF | View/Open |
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