https://scholars.lib.ntu.edu.tw/handle/123456789/324147
Title: | Abnormal trend detection of sequence-disordered data using EWMA method | Authors: | Fan, Jr-Min RUEY-SHAN GUO SHI-CHUNG CHANG Lee, Jian-Huei |
Issue Date: | 1996 | Start page/Pages: | 169-174 | Source: | IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-0030395438&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/324147 |
DOI: | 10.1109/asmc.1996.557991 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.