https://scholars.lib.ntu.edu.tw/handle/123456789/363035
Title: | Electrical characteristics analysis at "oxide flat-band voltage" for Al-SiO 2-Si capacitor | Authors: | Lu, H.-W. Chen, T.-Y. Hwu, J.-G. JENN-GWO HWU |
Issue Date: | 2011 | Journal Volume: | 35 | Journal Issue: | 4 | Start page/Pages: | 639-650 | Source: | ECS Transactions | URI: | http://www.scopus.com/inward/record.url?eid=2-s2.0-79960853269&partnerID=MN8TOARS http://scholars.lib.ntu.edu.tw/handle/123456789/363035 |
DOI: | 10.1149/1.3572310 |
Appears in Collections: | 電機工程學系 |
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