https://scholars.lib.ntu.edu.tw/handle/123456789/429672
Title: | An IR-drop guided test pattern generation technique | Authors: | L.-C. Tsai J.-Z. Li Y.-T. Lin J.-L. Huang A. Shih Z. F. Conroy JIUN-LANG HUANG |
Issue Date: | 2016 | Source: | International Symposium on VLSI Design, Automation and Test | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/429672 | DOI: | 10.1109/vlsi-dat.2016.7482581 |
Appears in Collections: | 電子工程學研究所 |
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