https://scholars.lib.ntu.edu.tw/handle/123456789/502114
Title: | BEOL TDDB reliability modeling and lifetime prediction using critical energy to breakdown. | Authors: | Chen, Pin-Shiang Lee, Shou-Chung Oates, A. S. CHEE-WEE LIU |
Issue Date: | 2018 | Start page/Pages: | 6 | Source: | IEEE International Reliability Physics Symposium, IRPS 2018, Burlingame, CA, USA, March 11-15, 2018 | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/502114 | DOI: | 10.1109/IRPS.2018.8353626 |
Appears in Collections: | 電機工程學系 |
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