https://scholars.lib.ntu.edu.tw/handle/123456789/516597
Title: | Comparative Leakage Analysis of GeOI FinFET and Ge Bulk FinFET | Authors: | V. P.-H. Hu M.-L. Fan P. Su C.-T. Chuang VITA PI-HO HU V. P.-H. Hu M.-L. Fan P. Su C.-T. Chuang 胡璧合 |
Issue Date: | 2013 | Journal Volume: | 60 | Start page/Pages: | 3596-3600 | Source: | IEEE Transactions on Electron Devices | URI: | https://scholars.lib.ntu.edu.tw/handle/123456789/516597 | DOI: | 10.1109/ted.2013.2278032 |
Appears in Collections: | 電機工程學系 |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.