https://scholars.lib.ntu.edu.tw/handle/123456789/559029
Title: | Edge-Etched Al<inf>2</inf>O<inf>3</inf>Dielectric as Charge Storage Region in a Coupled MIS Tunnel Diode Sensor | Authors: | Chen, B.-J. JENN-GWO HWU |
Issue Date: | 2020 | Journal Volume: | 8 | Start page/Pages: | 825-833 | Source: | IEEE Journal of the Electron Devices Society | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85089936480&partnerID=40&md5=eecf2999c3d39e9e4948b36fa0513627 https://scholars.lib.ntu.edu.tw/handle/123456789/559029 |
DOI: | 10.1109/JEDS.2020.3011996 |
Appears in Collections: | 電機工程學系 |
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