https://scholars.lib.ntu.edu.tw/handle/123456789/559050
Title: | Learning to Automate the Design Updates from Observed Engineering Changes in the Chip Development Cycle | Authors: | Kravets, V.N. Jiang, J.-H.R. Riener, H. JIE-HONG JIANG |
Issue Date: | 2020 | Start page/Pages: | 738-743 | Source: | Proceedings of the 2020 Design, Automation and Test in Europe Conference and Exhibition, DATE 2020 | URI: | https://www.scopus.com/inward/record.url?eid=2-s2.0-85087387819&partnerID=40&md5=766046202dcbecc07c9110600ea6a3a4 https://scholars.lib.ntu.edu.tw/handle/123456789/559050 |
DOI: | 10.23919/DATE48585.2020.9116310 |
Appears in Collections: | 電機工程學系 |
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