Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
2001 | 2001 deliverable report: intelligent multidimensional demand aggregation/disaggregation strategies | Chang, Shi-Chung; Hsu, Chia-Hau; Cheng, Yee-Chiu; Chen, Argon ; Guo, Ruey-Shan | | | |  |
2002 | 2002 deliverable report: forecasting methodologies for multidimensional aggregated demands | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Lan, Jakey | | | |  |
2003 | 2003 deliverable report: forecasting methodologies for multidimensional aggregated demands | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Huang, Tonny; Yang, Kyle; Tzeng, Janet | | | |  |
2005 | 2005 deliverable report: supply chain quadratic goal programming | Chen, Argon ; Chiang, David; Guo, Ruey-Shan ; Cheng, M.C.; Chang, B.C.; Chen, C.B.; Lan, Jakey; Hong, Amos | | | |  |
2002 | A Component Commonality-based Material Planning Model for the Assembly Industry | RUEY-SHAN GUO ; M. Yu; D. Chiang | The 4th Asia-Pacific Conference on Industrial Engineering and Management Systems | | | |
2009 | A Design Partner Selection Model for Design Chain Collaboration | RUEY-SHAN GUO; D. Chiang; J. Chen; RUEY-SHAN GUO | 2009 INFORMS Annual Meeting | | | |
1993 | A Methodology for Optimizing Gate Oxide Pre-clean | RUEY-SHAN GUO; K. Srikrishna; M. Slama; R. Guo; S. Geha; RUEY-SHAN GUO | Electrochemical Society | | | |
1998 | A Self-tuning EWMA Controller for Processes subject to Small and Large Disturbances | RUEY-SHAN GUO; S. Lu; A. Chen; R. Guo; J. Chen; RUEY-SHAN GUO | International Symposium on Semiconductor Manufacturing | | | |
1993 | A Work Cell Manufacturing System for VLSI Fabrication | RUEY-SHAN GUO; RUEY-SHAN GUO | International Electronics Manufacturing Technology Symposium | 0 | 0 | |
1996 | Abnormal Trend Detection of End-of-line Data Using EWMA Chart | RUEY-SHAN GUO; J. Lee; S. Chang; R. Guo; J. Fan; RUEY-SHAN GUO | Semiconductor Manufacturing Technology Workshop | | | |
1996 | Abnormal Trend Detection of Sequence-disordered Data Using EWMA Method | RUEY-SHAN GUO ; Fan, Jr-Min; Chang, Shi-Chung; Lee, Jian-Huei | Advanced Semiconductor Manufacturing Conference and Workshop | 4 | 0 | |
2000 | Age-based double EWMA controller and its application to a CMP process | Chen, A.; Guo, R.-S. | Run-to-Run Control in Semiconductor Manufacturing | 2 | | |
2001 | Age-Based Double EWMA Controller and Its Application to CMP Processes | Chen, Argon ; Guo, Ruey-Shan | IEEE transactions on semiconductor manufacturing | 119 | 102 |  |
1994 | Agile Flow Control in Semiconductor Manufacturing: Simulation and Animation Demonstration | Guo R.-S.; Griffin R.; Slama M.; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 0 | 0 | |
1993 | Agile Semiconductor Manufacturing System: From Job Shop to Work Cell | RUEY-SHAN GUO; K. Holman; M. Slama; R. Griffin; RUEY-SHAN GUO | Government Microcircuit Applications Conference | | | |
2021 | Altruism and social utility in consumer sharing behavior | Say A.L; Guo R.-S.A; CHIA-LIN CHEN ; RUEY-SHAN GUO | Journal of Consumer Behaviour | 7 | 8 | |
1997 | An Adaptive Process Controller for Semiconductor Manufacturing | RUEY-SHAN GUO; L. Huang; S. Wang; J. Chen; RUEY-SHAN GUO | Automatic Control Conference | | | |
1998 | An Enhanced Algorithm to Integrate Statistical Process Monitoring and Feedback Adjustment | RUEY-SHAN GUO; K. Wu; A. Chen; RUEY-SHAN GUO | International Conference on Automation Technology and International Conference of Production Research | | | |
1998 | An Integrated Approach to Semiconductor Equipment Monitoring | RUEY-SHAN GUO; A. Yang; A. Chen; RUEY-SHAN GUO | International Conference on Automation Technology and International Conference of Production Research | | | |
1998 | An Integrated Fault Detection Scheme for Wafer Acceptance Test Data | RUEY-SHAN GUO; S. Chang; C. Fan; RUEY-SHAN GUO | International Symposium on Semiconductor Manufacturing | | | |