Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
2021 | Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing | Rostami H; Blue J; Chen A; ARGON CHEN ; JAKEY BLUE | International Journal of Intelligent Systems | 4 | 4 | |
2018 | Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing | Rostami, H.; Blue, J.; Chen, A.; ARGON CHEN ; JAKEY BLUE | IEEE International Conference on Automation Science and Engineering | 0 | 0 | |
1999 | Function-based cost modeling for wafer manufacturing and its application to strategic management | Guo, Ruey-Shan ; Chen, Argon; Lin, Pei-Lan; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
1998 | An Integrated Approach to Semiconductor Equipment Monitoring | Chen, Argon ; Guo, Ruey-Shan ; Yang, Alex; Tseng, Chwan-Lu | Journal of The Chinese Society of Mechanical Engineering | 3 | | |
2003 | Integrated yield-mining solution with enhanced electrical test data correlation | Fan, Chih-Min; Guo, Ruey-Shan ; Chen, Argon ; Hon, Amos; Wei, John; King, Mingchu | The Ninth International Symposium on Semiconductor Manufacturing, 2003 | 0 | 0 | |
2002 | Integration of Demand Planning
and Manufacturing Planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2002 | Integration of Demand Planning
and Manufacturing Planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2002 | Integration of demand planning and manufacturing planning | Chou, Yon-Chun ; Chen, Argon | | | | |
2018 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy | | | | |
2003 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle | | | | |
2017 | Manufacturing Parameters Optimization in Functional Textile Dyeing Processes | Hong I.-H.; Shen Z.; Chen S.-C.; Chen A.; Tsai K.-C.; I-HSUAN HONG ; ARGON CHEN | Procedia Manufacturing | 3 | 0 | |
2021 | Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters | Shen Z; Hong A; ARGON CHEN | Advanced Engineering Informatics | | | |
1998 | Mean estimate for Shewhart-chart-monitored processes subject to random shifts | Chen, Argon ; Elsayed, E.A. | 1998 IEEE International Conference on Systems, Man, and Cybernetics | 0 | 0 | |
1999 | Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping | Guo, Ruey-Shan ; Chen, Argon; Liu, Cheewee; Lin, A.; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
2020 | Multi-Reader Multi-Case Study for Performance Evaluation of High-Risk Thyroid Ultrasound with Computer-Aided Detection | MING-HSUN WU ; KUEN-YUAN CHEN ; SHYANG-RONG SHIH ; MING-CHIH HO ; HAO-CHIH TAI ; KING-JEN CHANG ; CHIUNG-NIEN CHEN ; ARGON CHEN | Cancers | 11 | 10 | |
2022 | Multivariate multi-layer classifier | Zeng, Huanze; ARGON CHEN | Pattern Recognition | 0 | 0 | |
1993 | Optimal levels of process parameters for products with multiple characteristics | Elsayed, E.A.; ARGON CHEN | International Journal of Production Research | | | |
2008 | Optimal sampling in design of experiment for simulation-based stochastic optimization | Brantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN | 4th IEEE Conference on Automation Science and Engineering | | | |
2007 | Optimal supply chain configurations in semiconductor manufacturing | MING-HUANG CHIANG ; RUEY-SHAN GUO ; ARGON CHEN ; Cheng, Meng-Tse; Chen, Cheng-Bang | International Journal of Production Research | 15 | 15 | |
2009 | Optimum sampling for track PEB CD integrated metrology | Chen, A.; Hsueh, S.; ARGON CHEN ; JAKEY BLUE | 2009 IEEE International Conference on Automation Science and Engineering | 2 | 0 | |