Skip navigation
中文
English
DSpace
CRIS
Home
Organizations
Researchers
Research Outputs
Explore by
Organizations
Researchers
Research Outputs
Academic & Publications
Help
中文
English
NTU Scholars
Research Outputs
Browsing by Author
Lu, H.-W.
or enter first few letters:
Jump to:
0-9
A
B
C
D
E
F
G
H
I
J
K
L
M
N
O
P
Q
R
S
T
U
V
W
X
Y
Z
In order:
Ascending
Descending
Results/Page
5
10
15
20
25
30
35
40
45
50
55
60
65
70
75
80
85
90
95
100
Authors/Record:
All
1
5
10
15
20
25
30
35
40
45
50
Showing results 2 to 7 of 7
< previous
Issue Date
Title
Author(s)
Source
scopus
WOS
Fulltext/Archive link
2013
Effect of H2O on the electrical characteristics of ultra-thin SiO2 prepared with and without vacuum treatments after anodization
Chen, T.-Y.; Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU
Microelectronic Engineering
6
6
2011
Electrical characteristics analysis at "oxide flat-band voltage" for Al-SiO 2-Si capacitor
Lu, H.-W.; Chen, T.-Y.; Hwu, J.-G.; JENN-GWO HWU
ECS Transactions
2
0
2011
Influence of residual ions and gases at Si/SiO2 interface in ultra-thin gate oxide
Chen, T.-Y.; Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU
ECS Transactions
0
0
2013
Lateral nonuniformity of the tunneling current of Al/SiO2/p-Si capacitor in inversion region due to edge fringing field effect
Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU
ECS Transactions
11
0
2011
Photovoltaic characteristics of MOS structure with photo enhanced trap assist tunneling current by oxide etching
Wang, C.-Y.; Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU
International NanoElectronics Conference, INEC
0
0
2014
Roles of interface and oxide trap density in the kinked current behavior of Al/SiO2/Si(p) structures with ultra-thin oxides
Lu, H.-W.; Hwu, J.-G.; JENN-GWO HWU
Applied Physics A: Materials Science and Processing
11
13