公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2014 | GALAXY: A Multi-Circuit Simulator based on Inverse Jacobian Matrix Reuse | CHIEN-MO LI ; H.Y. Lee; C.Y. Han; CHIEN-MO LI | IEEE/ACM Design Automation Conference | | | |
2012 | GPU-Based Massively Parallel N-Detect Transition Delay Fault ATPG | CHIEN-MO LI ; KY Liao; SC Hsu; CHIEN-MO LI | IEEE Int’l Test Conf. | | | |
2012 | GPU-Based Massively Parallel N-Detect Transition Delay Fault ATPG, | CHIEN-MO LI ; K. Y. Liao; S. C. Hsu; CHIEN-MO LI | Design Automation Conference | | | |
2014 | GPU-Based Timing-Aware Test Generation for Small Delay Defects | CHIEN-MO LI ; K.Y. Liao; J. C.-M. Li; M. Hsiao; CHIEN-MO LI | IEEE European Test Symposium | | | |
2014 | GPU-based timing-aware test generation for small delay defects. | Liao, Kuan-Yu; Chen, Po-Juei; Lin, Ang-Feng; Li, James Chien-Mo; Hsiao, Michael S.; Wang, Laung-Terng; CHIEN-MO LI | 19th IEEE European Test Symposium, ETS 2014, Paderborn, Germany, May 26-30, 2014 | | | |
2020 | High Efficiency and Low Overkill Testing for Probabilistic Circuits | Lee M.-T; Wu C.-H; Liu S.-T; Hsieh C.-Y; CHIEN-MO LI | Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 | | | |
2023 | High-Speed, Low-Storage Power and Thermal Predictions for ATPG Test Patterns | Liang, Zhe Jia; Wu, Yu Tsung; Yang, Yun Feng; CHIEN-MO LI ; Chang, Norman; Kumar, Akhilesh; Li, Ying Shiun | Proceedings - International Test Conference | | | |
1998 | IDDQ data analysis using current signature | Li, J.C.M.; McCluskey, E.J.; CHIEN-MO LI | Proceeding - 1998 IEEE International Workshop on IDDQ Testing, IDDQ 1998 | | | |
2008 | IEEE 1500 Compatible Secure Test Wrapper For Embedded IP Cores | CHIEN-MO LI ; Geng-Ming Chiu; C.-Y. Chiu; R-Y. Wen; CHIEN-MO LI | International Test Conference | | | |
2021 | Improving Volume Diagnosis and Debug with Test Failure Clustering and Reorganization | Wu M.-T; Kuo C.-S; Li J.C.-M; Nigh C; Bhargava G.; CHIEN-MO LI | Proceedings - International Test Conference | | | |
2018 | IR drop prediction of ECO-revised circuits using machine learning | Lin, S.-Y.; Fang, Y.-C.; Li, Y.-C.; Liu, Y.-C.; Yang, T.-S.; Lin, S.-C.; Li, C.-M.; Fang, E.J.-W.; CHIEN-MO LI | Proceedings of the IEEE VLSI Test Symposium | | | |
2005 | Jump Scan: A DFT Technique for Low Power Testing, | CHIEN-MO LI ; M.H. Chiu; CHIEN-MO LI | IEEE VLSI Test Symposium | | | |
2006 | Jump Simulation: A Fast and Precise Scan Chain Diagnosis Technique | CHIEN-MO LI ; Y. L Kao; W. S. Chuang; CHIEN-MO LI | IEEE International Test Conference | | | |
2012 | Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains, | CHIEN-MO LI ; JIUN-LANG HUANG ; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI ; JIUN-LANG HUANG | ACM Transactions on Design Automation of Electronic Systems (TODAES) | | 0 | |
2006 | Logic and fault simulation | Huang, J.-L. ; Li, J.C.-M. ; Walker, D.M. | VLSI Test Principles and Architectures | 0 | 0 | |
2022 | Low-IR-Drop Test Pattern Regeneration Using A Fast Predictor | Liu, Shi Tang; Chen, Jia Xian; Wu, Yu Tsung; Hsieh, Chao Ho; CHIEN-MO LI ; Chang, Norman; Li, Ying Shiun; Chuang, Wen Tze | Proceedings - International Symposium on Quality Electronic Design, ISQED | 0 | 0 | |
2018 | Machine-learning-based dynamic IR drop prediction for ECO | Fang, Y.-C.; Lin, H.-Y.; Su, M.-Y.; Li, C.-M.; Fang, E.J.-W.; CHIEN-MO LI | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD | | | |
2010 | Method for adjusting clock domain during layout of integrated circuit and associated computer readable medium | CHIEN-MO LI ; J. Y. Wen; CHIEN-MO LI | | | | |
2021 | Minimum Operating Voltage Prediction in Production Test Using Accumulative Learning | Kuo Y.-T; Lin W.-C; Chen C; Hsieh C.-H; Li J.C.-M; Jia-Wei Fang E; Hsueh S.S.-Y.; CHIEN-MO LI | Proceedings - International Test Conference | | | |
2022 | ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption | Lin, Wei Chen; Chen, Chun; Hsieh, Chao Ho; CHIEN-MO LI ; Fang, Eric Jia Wei; Hsueh, Sung S.Y. | Proceedings - International Test Conference | 1 | 0 | |