第 1 到 106 筆結果,共 106 筆。
公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 | |
---|---|---|---|---|---|---|---|
1 | 2022 | Multivariate multi-layer classifier | Zeng, Huanze; ARGON CHEN | Pattern Recognition | 0 | 0 | |
2 | 2022 | Assessing Detection Accuracy of Computerized Sonographic Features and Computer-Assisted Reading Performance in Differentiating Thyroid Cancers | HAO-CHIH TAI ; KUEN-YUAN CHEN ; MING-HSUN WU ; KING-JEN CHANG ; CHIUNG-NIEN CHEN ; ARGON CHEN | Biomedicines | 1 | 1 | |
3 | 2021 | Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid Nodules | MING-HSUN WU ; KUEN-YUAN CHEN ; ARGON CHEN ; CHIUNG-NIEN CHEN | Annals of surgical oncology | 6 | 4 | |
4 | 2021 | Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parameters | Shen Z; Hong A; ARGON CHEN | Advanced Engineering Informatics | |||
5 | 2021 | Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablation | MING-HSUN WU ; KUEN-YUAN CHEN ; CHIUNG-NIEN CHEN ; ARGON CHEN | Clinical Endocrinology | 4 | 3 | |
6 | 2021 | ASO Author Reflections: Quantitative Shape Analysis of Thyroid Nodules: A Small But Important Step Towards Software-Based Preoperative Evaluation of Thyroid Nodules | MING-HSUN WU ; ARGON CHEN | Annals of Surgical Oncology | 0 | 0 | |
7 | 2021 | Equipment deterioration modeling and cause diagnosis in semiconductor manufacturing | Rostami H; Blue J; Chen A; ARGON CHEN ; JAKEY BLUE | International Journal of Intelligent Systems | 4 | 4 | |
8 | 2021 | Binary multi-layer classifier | Zeng H; ARGON CHEN | Information Sciences | |||
9 | 2021 | Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic Patterns | MING-HSUN WU ; KUEN-YUAN CHEN ; MIN-SHU HSIEH ; ARGON CHEN ; CHIUNG-NIEN CHEN | Frontiers in Endocrinology | 4 | 3 | |
10 | 2020 | Multi-Reader Multi-Case Study for Performance Evaluation of High-Risk Thyroid Ultrasound with Computer-Aided Detection | MING-HSUN WU ; KUEN-YUAN CHEN ; SHYANG-RONG SHIH ; MING-CHIH HO ; HAO-CHIH TAI ; KING-JEN CHANG ; CHIUNG-NIEN CHEN ; ARGON CHEN | Cancers | 11 | 10 | |
11 | 2020 | Comprehensive relative importance analysis and its applications to high dimensional gene expression data analysis | Shen, Z.; ARGON CHEN | Knowledge-Based Systems | 1 | ||
12 | 2020 | A 2-Phase Merge Filter Approach to Computer-Aided Detection of Breast Tumors on 3-Dimensional Ultrasound Imaging | Chiu, L.-Y.; WEN-HUNG KUO ; CHIUNG-NIEN CHEN ; KING-JEN CHANG ; ARGON CHEN | Journal of Ultrasound in Medicine | 0 | 0 | |
13 | 2020 | Ultrasonographic features for differentiating follicular thyroid carcinoma and follicular adenoma | TING-CHUN KUO ; MING-HSUN WU ; KUEN-YUAN CHEN ; MIN-SHU HSIEH ; ARGON CHEN ; CHIUNG-NIEN CHEN | Asian Journal of Surgery | 33 | 24 | |
14 | 2019 | Computerized Cytological Features for Papillary Thyroid Cancer Diagnosis-Preliminary Report | SHYANG-RONG SHIH ; I-SHIOW JAN ; KUEN-YUAN CHEN ; Chuang, Wan-Yu; CHIH-YUAN WANG ; Hsiao, Yung-Lien; TIEN-CHUN CHANG ; ARGON CHEN | Cancers | 3 | 2 | |
15 | 2019 | Classification tree with hybrid splitting mechanism | Zeng, H.; ARGON CHEN | SISY 2019 - IEEE 17th International Symposium on Intelligent Systems and Informatics, Proceedings | |||
16 | 2019 | A Variance-reduction Approach to Detection of the Thyroid-nodule Boundary on Ultrasound Images | Chiu, L.-Y.; ARGON CHEN | Ultrasonic Imaging | |||
17 | 2018 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy | ||||
18 | 2018 | Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor Manufacturing | Rostami, H.; Blue, J.; Chen, A.; ARGON CHEN ; JAKEY BLUE | IEEE International Conference on Automation Science and Engineering | 0 | 0 | |
19 | 2017 | Manufacturing Parameters Optimization in Functional Textile Dyeing Processes | Hong I.-H.; Shen Z.; Chen S.-C.; Chen A.; Tsai K.-C.; I-HSUAN HONG ; ARGON CHEN | Procedia Manufacturing | 3 | 0 | |
20 | 2016 | Quantitative analysis of echogenicity for patients with thyroid nodules | MING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Wang, Yu-Hsin; Chen, A.; ARGON CHEN ; KING-JEN CHANG | Scientific Reports | 32 | 32 | |
21 | 2015 | Efficient Splitting Simulation for Blackout Analysis | Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; CHIH-WEN LIU ; ARGON CHEN | IEEE Transactions on Power Systems | 22 | 21 | |
22 | 2015 | Applications of quantitative methods in semiconductor manufacturing | Lars Mönch; Argon Chen ; Andy (Myoungsoo) Ham; James Morrison | Computers and Operations Research | 0 | 0 | |
23 | 2014 | Computerized quantification of ultrasonic heterogeneity in thyroid nodules | KUEN-YUAN CHEN ; CHIUNG-NIEN CHEN ; MING-HSUN WU ; MING-CHIH HO ; HAO-CHIH TAI ; WEN-HUNG KUO ; Huang, Wen-Chang; Wang, Yu-Hsin; ARGON CHEN ; KING-JEN CHANG | Ultrasound in medicine & biology | 21 | 24 | |
24 | 2014 | A variance-reduction method for thyroid nodule boundary detection on ultrasound images | Chiu, L.-Y.; ARGON CHEN | IEEE International Conference on Automation Science and Engineering | |||
25 | 2013 | Efficient simulation budget allocation with regression | Brantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN | IIE Transactions | |||
26 | 2013 | Determining the influence of age and diabetes on the second-harmonic generation strength of dermal collagen fibers in vivo by using electronic noises | Hung, W.-C.; Sun, C.-K.; CHI-KUANG SUN ; ARGON CHEN | Progress in Biomedical Optics and Imaging - Proceedings of SPIE | 0 | 0 | |
27 | 2013 | Quantitative analysis of dynamic power doppler sonograms for patients with thyroid nodules | MING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Chung, Yuan-Chang; Lo, Chan-Peng; ARGON CHEN ; KING-JEN CHANG | Ultrasound in Medicine and Biology | 22 | 22 | |
28 | 2012 | Test of covariance changes without a large sample and its application to fault detection and classification | Hung Hung ; ARGON CHEN | Journal of Process Control | 5 | 4 | |
29 | 2012 | Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysis | Hong, A.; ARGON CHEN | Winter Simulation Conference | |||
30 | 2012 | Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysis | Hong, A.; ARGON CHEN | Journal of Process Control | |||
31 | 2011 | Rare-event splitting simulation for analysis of power system blackouts | Wang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; CHIH-WEN LIU ; ARGON CHEN | IEEE Power and Energy Society General Meeting | 19 | 0 | |
32 | 2011 | Computerized Detection and Quantification of Microcalcifications in Thyroid Nodules | KUEN-YUAN CHEN ; CHIUNG-NIEN CHEN ; MING-HSUN WU ; MING-CHIH HO ; HAO-CHIH TAI ; Huang, W.-C.; Chung, Y.-C.; ARGON CHEN ; KING-JEN CHANG | Ultrasound in Medicine and Biology | 24 | 23 | |
33 | 2010 | Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demands | Chen, Argon ; JAKEY BLUE | International Journal of Production Economics | |||
34 | 2010 | Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss Analysis | Chen, Argon ; Hong, Amos | IEEE Transactions on Semiconductor Manufacturing | 14 | 12 | |
35 | 2009 | Optimum sampling for track PEB CD integrated metrology | Chen, A.; Hsueh, S.; ARGON CHEN ; JAKEY BLUE | 2009 IEEE International Conference on Automation Science and Engineering | 2 | 0 | |
36 | 2009 | The conservation network of horseshoe crab Tachypleus tridentatus in Taiwan | Chen, C.-P.; Hsieh, H.-L.; Chen, A.; Yeh, H.-Y.; Lin, P.-F.; Wang, W.; ARGON CHEN | Biology and Conservation of Horseshoe Crabs | |||
37 | 2009 | Recipe-Independent Indicator for Tool Health Diagnosis and Predictive Maintenance | Chen, A.; ARGON CHEN ; JAKEY BLUE ; Chen, Argon | IEEE Transactions on Semiconductor Manufacturing | 33 | 29 | |
38 | 2009 | Priority cycle time behavior modeling for semiconductor fabs | Chang, S.-C.; Liao, B.-J.; Kao, Y.-T.; SHI-CHUNG CHANG ; ARGON CHEN | 1st International Conference on Advances in System Simulation | 0 | 0 | |
39 | 2008 | Taiwan’s paradigm shift – Industrial engineers are shaping a nation | Chen, Argon | Industrial Engineer | |||
40 | 2008 | Optimal sampling in design of experiment for simulation-based stochastic optimization | Brantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN | 4th IEEE Conference on Automation Science and Engineering | |||
41 | 2007 | 高效率迴歸樹之理論與軟體系統發展及其半導體良率分析之應用 (新制多年期第1年) | 陳正剛 | ||||
42 | 2007 | 高效率迴歸樹之理論與軟體系統發展及其半導體良率分析之應用 (新制多年期第2年) | 陳正剛 | ||||
43 | 2007 | 利用線性及非線性多變量統計方法分析癌症基因微陣列資料之研究 (新制多年期第2年) | 陳正剛 | ||||
44 | 2007 | 利用線性及非線性多變量統計方法分析癌症基因微陣列資料之研究 (新制多年期第1年) | 陳正剛 | ||||
45 | 2007 | Product-mix estimate with dynamic weighting scheme and its application to semiconductor industry | Chen, Argon ; Yang, K.; Hsia, Z. | International Journal of Production Research | |||
46 | 2007 | Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deterioration | Chen, Argon ; Wu, G.S. | International Journal of Production Research | 65 | 46 | |
47 | 2007 | Optimal supply chain configurations in semiconductor manufacturing | MING-HUANG CHIANG ; RUEY-SHAN GUO ; ARGON CHEN ; Cheng, Meng-Tse; Chen, Cheng-Bang | International Journal of Production Research | 15 | 15 | |
48 | 2007 | Statistical multi-objective optimization and its application to IC layout design for E-tests | Chen, A.; Chen, V.; Hsu, C.; ARGON CHEN | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | |||
49 | 2007 | Real-time equipment health prognosis and dynamic preventive maintenance policy | Chen, Argon ; Wu, G.S. | International Journal of Production Research | |||
50 | 2007 | Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planning | Chen, Argon ; Hsu, C.-H.; JAKEY BLUE | International Journal of Production Research | 18 | 13 | |
51 | 2007 | Design of EWMA and CUSUM control charts subject to random shift sizes and quality impacts | Chen, Argon ; Chen, Y.K. | IIE Transactions | 41 | 39 | |
52 | 2007 | Weighted least-square estimation of demand product mix and its applications to semiconductor demand | Chen, Argon ; Yang, Kyle; Hsia, Ziv | International Journal of Production Research | 9 | 7 | |
53 | 2007 | Performance analysis of demand planning approaches to aggregating and forecasting interrelated demands | Chen, Argon ; Hsu, C.H.; Lan, Jakey | International Journal of Production Research | |||
54 | 2006 | Recipe-independent tool health indicator and fault prognosis | Chen, A.; Blue, J.; Chou, T.-C.; ARGON CHEN ; JAKEY BLUE | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 2 | 0 | |
55 | 2006 | A quadratic goal programming model and sensitivity analysis for semiconductor supply chain | Chiang, D.; Guo, R.-S.; Chen, A.; ARGON CHEN ; MING-HUANG CHIANG ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 0 | 0 | |
56 | 2006 | Priority behavior modeling of fab for supply chain management | Chang, S.-C.; Liao, B.-J.; SHI-CHUNG CHANG ; ARGON CHEN | IEEE International Symposium on Semiconductor Manufacturing Conference | 0 | 0 | |
57 | 2006 | Sample Efficient Regression Trees (SERT) for yield loss analysis | Chen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | |||
58 | 2005 | Configuration, monitoring and control of semiconductor supply chains | Chang, Shi-Chung; Chen, Argon ; Chou, Yon | ||||
59 | 2005 | 2005 deliverable report: supply chain quadratic goal programming | Chen, Argon ; Chiang, David; Guo, Ruey-Shan ; Cheng, M.C.; Chang, B.C.; Chen, C.B.; Lan, Jakey; Hong, Amos | ||||
60 | 2005 | 半導體製造之資料探勘技術與知識網絡建立─子計畫一:半導體需求資料探擷與知識發掘應用於產能配置最佳化之研究(3/3) | 陳正剛 | ||||
61 | 2005 | 12吋晶圓製造服務佳化工具與標竿環境之研發─子計畫五:多步程製造系統演進最佳化方法及應用於晶圓廠良率提昇之研究(2/3) | 陳正剛 | ||||
62 | 2005 | Systematic Preprocessing of One-Color Microarray and Multi-Phenotype Data for Discovery of Differentially Expressed Genes | Chen, Argon ; Lin, Tiffany; Lin, J.H. | Bulletin of the College of Engineering | |||
63 | 2004 | 半導體製造之資料探勘技術與知識網絡建立─子計畫一:半導體需求資料探擷與知識發掘應用於產能配置最佳化之研究(2/3) | 陳正剛 | ||||
64 | 2004 | 工業工程與管理學門赴歐洲考察計畫 | 陳正剛 | ||||
65 | 2004 | 12吋晶圓製造服務佳化工具與標竿環境之研發─子計畫五:多步程製造系統演進最佳化方法及應用於晶圓廠良率提昇之研究(1/3) | 陳正剛 | ||||
66 | 2003 | Semiconductor product-mix estimate with dynamic weighting scheme | Chen, Argon ; Hsia, Ziv; Yang, Kyle | 2003 IEEE International Symposium on Semiconductor Manufacturing | |||
67 | 2003 | Integrated yield-mining solution with enhanced electrical test data correlation | Fan, Chih-Min; Guo, Ruey-Shan ; Chen, Argon ; Hon, Amos; Wei, John; King, Mingchu | The Ninth International Symposium on Semiconductor Manufacturing, 2003 | 0 | 0 | |
68 | 2003 | Rationality and Risk Analysis in Capacity Planning | Chou, Yon-Chun ; Chen, Argon | ||||
69 | 2003 | Intelligent Demand Aggregation and Forecasting | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle | ||||
70 | 2003 | 2003 deliverable report: forecasting methodologies for multidimensional aggregated demands | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Huang, Tonny; Yang, Kyle; Tzeng, Janet | ||||
71 | 2003 | 半導體製造之資料探勘技術與知識網絡建立─子計畫一:半導體需求資料探擷與知識發掘應用於產能配置最佳化之研究(1/3) | 陳正剛 | ||||
72 | 2002 | Integration of Demand Planning and Manufacturing Planning | Chou, Yon-Chun ; Chen, Argon | ||||
73 | 2002 | Integration of demand planning and manufacturing planning | Chou, Yon-Chun ; Chen, Argon | ||||
74 | 2002 | Integration of Demand Planning and Manufacturing Planning | Chou, Yon-Chun ; Chen, Argon | ||||
75 | 2002 | 半導體供應網路決策品質促成技術研究─子計畫三:半導體生產網路中之需求規劃策略 (II) | 陳正剛 | ||||
76 | 2002 | Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step Changes | Chen, Argon ; Elsayed, E. A. | Technometrics | |||
77 | 2002 | Design and performance analysis ofthe exponentially weighted moving average mean estimate for processes subject to random step changes | Chen, A.; Elsayed, E.A.; ARGON CHEN | Technometrics | |||
78 | 2002 | 2002 deliverable report: forecasting methodologies for multidimensional aggregated demands | Chen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Lan, Jakey | ||||
79 | 2002 | 供應鏈系統資訊物件模型之建構與整合 | 陳正剛 | ||||
80 | 2001 | Age-Based Double EWMA Controller and Its Application to CMP Processes | Chen, Argon ; Guo, Ruey-Shan | IEEE transactions on semiconductor manufacturing | 121 | 103 | |
81 | 2001 | 半導體供應網路決策品質促成技術研究(I)─子計畫三:半導體生產網路中之需求規劃策略 | 陳正剛 | ||||
82 | 2001 | 2001 deliverable report: intelligent multidimensional demand aggregation/disaggregation strategies | Chang, Shi-Chung; Hsu, Chia-Hau; Cheng, Yee-Chiu; Chen, Argon ; Guo, Ruey-Shan | ||||
83 | 2001 | Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data | Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; ARGON CHEN ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings | 12 | 0 | |
84 | 2000 | An effective SPC approach to monitoring semiconductor manufacturing processes with multiple variation sources | Chen, Argon ; Guo, R.S.; Yeh, P.J. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
85 | 2000 | Statistical analysis and design of semiconductor manufacturing systems | Chen, Argon ; Guo, P.S.; Lin, Puffy | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
86 | 2000 | Real-time equipment health evaluation and dynamic preventive maintenance | Chen, Argon ; Guo, R.S.; Wu, G.S. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
87 | 2000 | An effective SPC approach to monitoring semiconductor quality data with multiple variation sources | Chen, Argon ; Guo, Ruey-Shan ; ARGON CHEN ; RUEY-SHAN GUO | Semiconductor Manufacturing Technology Workshop | 1 | 0 | |
88 | 2000 | Run-to-run control schemes for CMP process subject to deterministic drifts | Guo, Ruey-Shan ; Chen, Argon; ARGON CHEN | Semiconductor Manufacturing Technology Workshop | 18 | 0 | |
89 | 2000 | 多重變異來源特性之半導體製程取樣與統計製程管制策略 | 陳正剛 ; 郭瑞祥 ; 葉珮甄 | 中國統計學報 | |||
90 | 2000 | Age-based double EWMA controller and its application to a CMP process | Chen, A.; Guo, R.-S.; ARGON CHEN | Run-to-Run Control in Semiconductor Manufacturing | |||
91 | 2000 | 晶圓廠總體設備效能提昇與管理系統(2/2)─子計畫三:半導體設備監看與預防保養 | 陳正剛 | ||||
92 | 2000 | An alternative mean estimator for processes monitored by SPC charts | Chen, Argon ; Elsayed, E. A. | International Journal of Production Research | 13 | 13 | |
93 | 1999 | Function-based cost modeling for wafer manufacturing and its application to strategic management | Guo, Ruey-Shan ; Chen, Argon; Lin, Pei-Lan; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
94 | 1999 | Run-to-run control of CMP process considering aging effects of pad and disc | Chen, Argon ; Guo, Ruey-Shan ; Chou, Y.L.; Lin, C.L.; Dun, Jowei; ARGON CHEN | Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on | 6 | 0 | |
95 | 1999 | Modeling and optimization of wafer-level spatial uniformity with the use of rational subgrouping | Guo, Ruey-Shan ; Chen, Argon; Liu, Cheewee; Lin, A.; ARGON CHEN | 1999 IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |
96 | 1999 | A self-tuning run-by-run process controller for processes subject to random disturbances | Guo R.-S.; Chen J.-J.; Chen A.; Lu S.-S.; RUEY-SHAN GUO ; ARGON CHEN | Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an | 5 | 4 | |
97 | 1999 | 提昇製程品質控制績效之研究-結合管制圖與移動平均控制法 | 郭瑞祥 ; 陳正剛 ; 吳廣瀅 | 管理學報 | |||
98 | 1998 | Mean estimate for Shewhart-chart-monitored processes subject to random shifts | Chen, Argon ; Elsayed, E.A. | 1998 IEEE International Conference on Systems, Man, and Cybernetics | 0 | 0 | |
99 | 1998 | A real-time equipment monitoring and fault detection system | Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S. ; Huang, S.J.; Lee, Y.C.; Chang, S.G.; RUEY-SHAN GUO ; ARGON CHEN | Semiconductor Manufacturing Technology Workshop | 8 | 0 | |
100 | 1998 | 半導體產業中製程監控之取樣策略 | 陳正剛 | ||||
101 | 1998 | 在自由競爭市場中之短期負載建模與預測 | 陳正剛 | ||||
102 | 1998 | An Alternative Dynamic Programming Approach to Allocation Inspection Points in Multistage Production Systems | Chen, Argon | Quality Engineering | |||
103 | 1998 | An Integrated Approach to Semiconductor Equipment Monitoring | Chen, Argon ; Guo, Ruey-Shan ; Yang, Alex; Tseng, Chwan-Lu | Journal of The Chinese Society of Mechanical Engineering | 3 | ||
104 | 1997 | 統計製程控制應用在電腦整合製造系統的適用性研究 | 陳正剛 | ||||
105 | 1994 | An economic design of x control chart using quadratic loss function | Elsayed, E.A.; ARGON CHEN | International Journal of Production Research | |||
106 | 1993 | Optimal levels of process parameters for products with multiple characteristics | Elsayed, E.A.; ARGON CHEN | International Journal of Production Research |