第 1 到 106 筆結果,共 106 筆。

公開日期標題作者來源出版物scopusWOS全文
12022Multivariate multi-layer classifierZeng, Huanze; ARGON CHEN Pattern Recognition00
22022Assessing Detection Accuracy of Computerized Sonographic Features and Computer-Assisted Reading Performance in Differentiating Thyroid CancersHAO-CHIH TAI ; KUEN-YUAN CHEN ; MING-HSUN WU ; KING-JEN CHANG ; CHIUNG-NIEN CHEN ; ARGON CHEN Biomedicines11
32021Software-Based Analysis of the Taller-Than-Wide Feature of High-Risk Thyroid NodulesMING-HSUN WU ; KUEN-YUAN CHEN ; ARGON CHEN ; CHIUNG-NIEN CHEN Annals of surgical oncology64
42021ASO Author Reflections: Quantitative Shape Analysis of Thyroid Nodules: A Small But Important Step Towards Software-Based Preoperative Evaluation of Thyroid NodulesMING-HSUN WU ; ARGON CHEN Annals of Surgical Oncology00
52021Equipment deterioration modeling and cause diagnosis in semiconductor manufacturingRostami H; Blue J; Chen A; ARGON CHEN ; JAKEY BLUE International Journal of Intelligent Systems44
62021Binary multi-layer classifierZeng H; ARGON CHEN Information Sciences
72021Risk Stratification in Patients With Follicular Neoplasm on Cytology: Use of Quantitative Characteristics and Sonographic PatternsMING-HSUN WU ; KUEN-YUAN CHEN ; MIN-SHU HSIEH ; ARGON CHEN ; CHIUNG-NIEN CHEN Frontiers in Endocrinology43
82021Differences in the ultrasonographic appearance of thyroid nodules after radiofrequency ablationMING-HSUN WU ; KUEN-YUAN CHEN ; CHIUNG-NIEN CHEN ; ARGON CHEN Clinical Endocrinology43
92021Many-to-many comprehensive relative importance analysis and its applications to analysis of semiconductor electrical testing parametersShen Z; Hong A; ARGON CHEN Advanced Engineering Informatics
102020Multi-Reader Multi-Case Study for Performance Evaluation of High-Risk Thyroid Ultrasound with Computer-Aided DetectionMING-HSUN WU ; KUEN-YUAN CHEN ; SHYANG-RONG SHIH ; MING-CHIH HO ; HAO-CHIH TAI ; KING-JEN CHANG ; CHIUNG-NIEN CHEN ; ARGON CHEN Cancers1110
112020Ultrasonographic features for differentiating follicular thyroid carcinoma and follicular adenomaTING-CHUN KUO ; MING-HSUN WU ; KUEN-YUAN CHEN ; MIN-SHU HSIEH ; ARGON CHEN ; CHIUNG-NIEN CHEN Asian Journal of Surgery3024
122020A 2-Phase Merge Filter Approach to Computer-Aided Detection of Breast Tumors on 3-Dimensional Ultrasound ImagingChiu, L.-Y.; WEN-HUNG KUO ; CHIUNG-NIEN CHEN ; KING-JEN CHANG ; ARGON CHEN Journal of Ultrasound in Medicine00
132020Comprehensive relative importance analysis and its applications to high dimensional gene expression data analysisShen, Z.; ARGON CHEN Knowledge-Based Systems1
142019Computerized Cytological Features for Papillary Thyroid Cancer Diagnosis-Preliminary ReportSHYANG-RONG SHIH ; I-SHIOW JAN ; KUEN-YUAN CHEN ; Chuang, Wan-Yu; CHIH-YUAN WANG ; Hsiao, Yung-Lien; TIEN-CHUN CHANG ; ARGON CHEN Cancers32
152019A Variance-reduction Approach to Detection of the Thyroid-nodule Boundary on Ultrasound ImagesChiu, L.-Y.; ARGON CHEN Ultrasonic Imaging
162019Classification tree with hybrid splitting mechanismZeng, H.; ARGON CHEN SISY 2019 - IEEE 17th International Symposium on Intelligent Systems and Informatics, Proceedings
172018Intelligent Demand Aggregation and ForecastingChen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Blue, Jakey; Chang, Felix; Chen, Ken; Hsia, Ziv; Hsie, B.W.; Lin, Peggy
182018Equipment Deterioration Modeling and Causes Diagnosis in Semiconductor ManufacturingRostami, H.; Blue, J.; Chen, A.; ARGON CHEN ; JAKEY BLUE IEEE International Conference on Automation Science and Engineering00
192017Manufacturing Parameters Optimization in Functional Textile Dyeing ProcessesHong I.-H.; Shen Z.; Chen S.-C.; Chen A.; Tsai K.-C.; I-HSUAN HONG ; ARGON CHEN Procedia Manufacturing30
202016Quantitative analysis of echogenicity for patients with thyroid nodulesMING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Wang, Yu-Hsin; Chen, A.; ARGON CHEN ; KING-JEN CHANG Scientific Reports3232
212015Efficient Splitting Simulation for Blackout AnalysisWang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; Shortle, J.; CHIH-WEN LIU ; ARGON CHEN IEEE Transactions on Power Systems2221
222015Applications of quantitative methods in semiconductor manufacturingLars Mönch; Argon Chen ; Andy (Myoungsoo) Ham; James MorrisonComputers and Operations Research00
232014Computerized quantification of ultrasonic heterogeneity in thyroid nodulesKUEN-YUAN CHEN ; CHIUNG-NIEN CHEN ; MING-HSUN WU ; MING-CHIH HO ; HAO-CHIH TAI ; WEN-HUNG KUO ; Huang, Wen-Chang; Wang, Yu-Hsin; ARGON CHEN ; KING-JEN CHANG Ultrasound in medicine & biology2124
242014A variance-reduction method for thyroid nodule boundary detection on ultrasound imagesChiu, L.-Y.; ARGON CHEN IEEE International Conference on Automation Science and Engineering
252013Quantitative analysis of dynamic power doppler sonograms for patients with thyroid nodulesMING-HSUN WU ; CHIUNG-NIEN CHEN ; KUEN-YUAN CHEN ; MING-CHIH HO ; HAO-CHIH TAI ; Chung, Yuan-Chang; Lo, Chan-Peng; ARGON CHEN ; KING-JEN CHANG Ultrasound in Medicine and Biology2222
262013Determining the influence of age and diabetes on the second-harmonic generation strength of dermal collagen fibers in vivo by using electronic noisesHung, W.-C.; Sun, C.-K.; CHI-KUANG SUN ; ARGON CHEN Progress in Biomedical Optics and Imaging - Proceedings of SPIE00
272013Efficient simulation budget allocation with regressionBrantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN IIE Transactions
282012Dominance index for many-to-many correlation and its applicaions to semiconductor yield analysisHong, A.; ARGON CHEN Winter Simulation Conference
292012Test of covariance changes without a large sample and its application to fault detection and classificationHung Hung ; ARGON CHEN Journal of Process Control54
302012Piecewise regression model construction with sample efficient regression tree (SERT) and applications to semiconductor yield analysisHong, A.; ARGON CHEN Journal of Process Control
312011Rare-event splitting simulation for analysis of power system blackoutsWang, S.-P.; Chen, A.; Liu, C.-W.; Chen, C.-H.; CHIH-WEN LIU ; ARGON CHEN IEEE Power and Energy Society General Meeting190
322011Computerized Detection and Quantification of Microcalcifications in Thyroid NodulesKUEN-YUAN CHEN ; CHIUNG-NIEN CHEN ; MING-HSUN WU ; MING-CHIH HO ; HAO-CHIH TAI ; Huang, W.-C.; Chung, Y.-C.; ARGON CHEN ; KING-JEN CHANG Ultrasound in Medicine and Biology2423
332010Sample-Efficient Regression Trees (SERT) for Semiconductor Yield Loss AnalysisChen, Argon ; Hong, AmosIEEE Transactions on Semiconductor Manufacturing1412
342010Performance analysis of demand planning approaches for aggregating, forecasting and disaggregating interrelated demandsChen, Argon ; JAKEY BLUE International Journal of Production Economics
352009Optimum sampling for track PEB CD integrated metrologyChen, A.; Hsueh, S.; ARGON CHEN ; JAKEY BLUE 2009 IEEE International Conference on Automation Science and Engineering20
362009The conservation network of horseshoe crab Tachypleus tridentatus in TaiwanChen, C.-P.; Hsieh, H.-L.; Chen, A.; Yeh, H.-Y.; Lin, P.-F.; Wang, W.; ARGON CHEN Biology and Conservation of Horseshoe Crabs
372009Priority cycle time behavior modeling for semiconductor fabsChang, S.-C.; Liao, B.-J.; Kao, Y.-T.; SHI-CHUNG CHANG ; ARGON CHEN 1st International Conference on Advances in System Simulation00
382009Recipe-Independent Indicator for Tool Health Diagnosis and Predictive MaintenanceChen, A.; ARGON CHEN ; JAKEY BLUE ; Chen, Argon IEEE Transactions on Semiconductor Manufacturing3329
392008Taiwan’s paradigm shift – Industrial engineers are shaping a nationChen, Argon Industrial Engineer 
402008Optimal sampling in design of experiment for simulation-based stochastic optimizationBrantley, M.W.; Lee, L.H.; Chen, C.-H.; ARGON CHEN 4th IEEE Conference on Automation Science and Engineering
412007高效率迴歸樹之理論與軟體系統發展及其半導體良率分析之應用 (新制多年期第1年)陳正剛 
422007利用線性及非線性多變量統計方法分析癌症基因微陣列資料之研究 (新制多年期第2年)陳正剛 
432007利用線性及非線性多變量統計方法分析癌症基因微陣列資料之研究 (新制多年期第1年)陳正剛 
442007高效率迴歸樹之理論與軟體系統發展及其半導體良率分析之應用 (新制多年期第2年)陳正剛 
452007Product-mix estimate with dynamic weighting scheme and its application to semiconductor industryChen, Argon ; Yang, K.; Hsia, Z.International Journal of Production Research 
462007Real-time equipment health prognosis and dynamic preventive maintenance policyChen, Argon ; Wu, G.S.International Journal of Production Research 
472007Demand planning approaches to aggregating and forecasting interrelated demands for safety stock and backup capacity planningChen, Argon ; Hsu, C.-H.; JAKEY BLUE International Journal of Production Research1813
482007Performance analysis of demand planning approaches to aggregating and forecasting interrelated demandsChen, Argon ; Hsu, C.H.; Lan, JakeyInternational Journal of Production Research 
492007Weighted least-square estimation of demand product mix and its applications to semiconductor demandChen, Argon ; Yang, Kyle; Hsia, ZivInternational Journal of Production Research97
502007Design of EWMA and CUSUM control charts subject to random shift sizes and quality impactsChen, Argon ; Chen, Y.K.IIE Transactions4139
512007Statistical multi-objective optimization and its application to IC layout design for E-testsChen, A.; Chen, V.; Hsu, C.; ARGON CHEN IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
522007Optimal supply chain configurations in semiconductor manufacturingMING-HUANG CHIANG ; RUEY-SHAN GUO ; ARGON CHEN ; Cheng, Meng-Tse; Chen, Cheng-BangInternational Journal of Production Research1515
532007Real-time health prognosis and dynamic preventive maintenance policy for equipment under aging Markovian deteriorationChen, Argon ; Wu, G.S.International Journal of Production Research6546
542006Recipe-independent tool health indicator and fault prognosisChen, A.; Blue, J.; Chou, T.-C.; ARGON CHEN ; JAKEY BLUE IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings20
552006A quadratic goal programming model and sensitivity analysis for semiconductor supply chainChiang, D.; Guo, R.-S.; Chen, A.; ARGON CHEN ; MING-HUANG CHIANG ; RUEY-SHAN GUO IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings00
562006Sample Efficient Regression Trees (SERT) for yield loss analysisChen, A.; Hong, A.; Ho, O.; Liu, C.-W.; Huang, Y.-H.; ARGON CHEN IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings
572006Priority behavior modeling of fab for supply chain managementChang, S.-C.; Liao, B.-J.; SHI-CHUNG CHANG ; ARGON CHEN IEEE International Symposium on Semiconductor Manufacturing Conference00
582005Configuration, monitoring and control of semiconductor supply chainsChang, Shi-Chung; Chen, Argon ; Chou, Yon 
5920052005 deliverable report: supply chain quadratic goal programmingChen, Argon ; Chiang, David; Guo, Ruey-Shan ; Cheng, M.C.; Chang, B.C.; Chen, C.B.; Lan, Jakey; Hong, Amos
60200512吋晶圓製造服務佳化工具與標竿環境之研發─子計畫五:多步程製造系統演進最佳化方法及應用於晶圓廠良率提昇之研究(2/3)陳正剛 
612005Systematic Preprocessing of One-Color Microarray and Multi-Phenotype Data for Discovery of Differentially Expressed GenesChen, Argon ; Lin, Tiffany; Lin, J.H.Bulletin of the College of Engineering 
622005半導體製造之資料探勘技術與知識網絡建立─子計畫一:半導體需求資料探擷與知識發掘應用於產能配置最佳化之研究(3/3)陳正剛 
632004工業工程與管理學門赴歐洲考察計畫陳正剛 
64200412吋晶圓製造服務佳化工具與標竿環境之研發─子計畫五:多步程製造系統演進最佳化方法及應用於晶圓廠良率提昇之研究(1/3)陳正剛 
652004半導體製造之資料探勘技術與知識網絡建立─子計畫一:半導體需求資料探擷與知識發掘應用於產能配置最佳化之研究(2/3)陳正剛 
662003Semiconductor product-mix estimate with dynamic weighting schemeChen, Argon ; Hsia, Ziv; Yang, Kyle2003 IEEE International Symposium on Semiconductor Manufacturing
672003Integrated yield-mining solution with enhanced electrical test data correlationFan, Chih-Min; Guo, Ruey-Shan ; Chen, Argon ; Hon, Amos; Wei, John; King, MingchuThe Ninth International Symposium on Semiconductor Manufacturing, 200300
682003Rationality and Risk Analysis in Capacity PlanningChou, Yon-Chun ; Chen, Argon 
692003Intelligent Demand Aggregation and ForecastingChen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Cheng, Janet; Ho, Odey; Fu, Legend; Huang, Tony; Yang, Kyle
7020032003 deliverable report: forecasting methodologies for multidimensional aggregated demandsChen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Huang, Tonny; Yang, Kyle; Tzeng, Janet
712003半導體製造之資料探勘技術與知識網絡建立─子計畫一:半導體需求資料探擷與知識發掘應用於產能配置最佳化之研究(1/3)陳正剛 
722002Integration of Demand Planning and Manufacturing PlanningChou, Yon-Chun ; Chen, Argon 
732002Integration of demand planning and manufacturing planningChou, Yon-Chun ; Chen, Argon 
742002Integration of Demand Planning and Manufacturing PlanningChou, Yon-Chun ; Chen, Argon 
7520022002 deliverable report: forecasting methodologies for multidimensional aggregated demandsChen, Argon ; Guo, Ruey-Shan ; Chang, Shi-Chung; Chen, Kenk; Hsia, Ziv; Lan, Jakey
762002Design and performance analysis ofthe exponentially weighted moving average mean estimate for processes subject to random step changesChen, A.; Elsayed, E.A.; ARGON CHEN Technometrics
772002Design and Performance Analysis of the Exponentially Weighted Moving Average Mean Estimate for Processes Subject to Random Step ChangesChen, Argon ; Elsayed, E. A.Technometrics 
782002半導體供應網路決策品質促成技術研究─子計畫三:半導體生產網路中之需求規劃策略 (II)陳正剛 
792002供應鏈系統資訊物件模型之建構與整合陳正剛 
802001Age-Based Double EWMA Controller and Its Application to CMP ProcessesChen, Argon ; Guo, Ruey-Shan IEEE transactions on semiconductor manufacturing121103
812001Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing dataFan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; ARGON CHEN ; RUEY-SHAN GUO IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings120
8220012001 deliverable report: intelligent multidimensional demand aggregation/disaggregation strategiesChang, Shi-Chung; Hsu, Chia-Hau; Cheng, Yee-Chiu; Chen, Argon ; Guo, Ruey-Shan 
832001半導體供應網路決策品質促成技術研究(I)─子計畫三:半導體生產網路中之需求規劃策略陳正剛 
842000Real-time equipment health evaluation and dynamic preventive maintenanceChen, Argon ; Guo, R.S.; Wu, G.S.The Ninth International Symposium on Semiconductor Manufacturing, 200000
852000Statistical analysis and design of semiconductor manufacturing systemsChen, Argon ; Guo, P.S.; Lin, PuffyThe Ninth International Symposium on Semiconductor Manufacturing, 200000
862000An effective SPC approach to monitoring semiconductor manufacturing processes with multiple variation sourcesChen, Argon ; Guo, R.S.; Yeh, P.J.The Ninth International Symposium on Semiconductor Manufacturing, 200000
872000Run-to-run control schemes for CMP process subject to deterministic driftsGuo, Ruey-Shan ; Chen, Argon; ARGON CHEN Semiconductor Manufacturing Technology Workshop180
882000An effective SPC approach to monitoring semiconductor quality data with multiple variation sourcesChen, Argon ; Guo, Ruey-Shan ; ARGON CHEN ; RUEY-SHAN GUO Semiconductor Manufacturing Technology Workshop10
892000多重變異來源特性之半導體製程取樣與統計製程管制策略陳正剛 ; 郭瑞祥 ; 葉珮甄中國統計學報 
902000晶圓廠總體設備效能提昇與管理系統(2/2)─子計畫三:半導體設備監看與預防保養陳正剛 
912000An alternative mean estimator for processes monitored by SPC chartsChen, Argon ; Elsayed, E. A.International Journal of Production Research1313
922000Age-based double EWMA controller and its application to a CMP processChen, A.; Guo, R.-S.; ARGON CHEN Run-to-Run Control in Semiconductor Manufacturing
931999Run-to-run control of CMP process considering aging effects of pad and discChen, Argon ; Guo, Ruey-Shan ; Chou, Y.L.; Lin, C.L.; Dun, Jowei; ARGON CHEN Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on60
941999Modeling and optimization of wafer-level spatial uniformity with the use of rational subgroupingGuo, Ruey-Shan ; Chen, Argon; Liu, Cheewee; Lin, A.; ARGON CHEN 1999 IEEE International Symposium on Semiconductor Manufacturing Conference20
951999Function-based cost modeling for wafer manufacturing and its application to strategic managementGuo, Ruey-Shan ; Chen, Argon; Lin, Pei-Lan; ARGON CHEN 1999 IEEE International Symposium on Semiconductor Manufacturing Conference20
961999A self-tuning run-by-run process controller for processes subject to random disturbancesGuo R.-S.; Chen J.-J.; Chen A.; Lu S.-S.; RUEY-SHAN GUO ; ARGON CHEN Journal of the Chinese Institute of Engineers, Transactions of the Chinese Institute of Engineers,Series A/Chung-kuo Kung Ch'eng Hsuch K'an54
971999提昇製程品質控制績效之研究-結合管制圖與移動平均控制法郭瑞祥 ; 陳正剛 ; 吳廣瀅管理學報
981998Mean estimate for Shewhart-chart-monitored processes subject to random shiftsChen, Argon ; Elsayed, E.A.1998 IEEE International Conference on Systems, Man, and Cybernetics00
991998A real-time equipment monitoring and fault detection systemGuo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S. ; Huang, S.J.; Lee, Y.C.; Chang, S.G.; RUEY-SHAN GUO ; ARGON CHEN Semiconductor Manufacturing Technology Workshop80
1001998在自由競爭市場中之短期負載建模與預測陳正剛 
1011998An Integrated Approach to Semiconductor Equipment MonitoringChen, Argon ; Guo, Ruey-Shan ; Yang, Alex; Tseng, Chwan-LuJournal of The Chinese Society of Mechanical Engineering3
1021998An Alternative Dynamic Programming Approach to Allocation Inspection Points in Multistage Production SystemsChen, Argon Quality Engineering 
1031998半導體產業中製程監控之取樣策略陳正剛 
1041997統計製程控制應用在電腦整合製造系統的適用性研究陳正剛 
1051994An economic design of x control chart using quadratic loss functionElsayed, E.A.; ARGON CHEN International Journal of Production Research
1061993Optimal levels of process parameters for products with multiple characteristicsElsayed, E.A.; ARGON CHEN International Journal of Production Research